Power-aware test is a major manufacturing consideration due to the problems of increased power dissipation in various test modes, as well as test implications that come up with the usage of various ...

The Design-for-Test (DFT) methodology is a strong driving force in the cost-effective testing of large-volume commodity items with very short life cycles, like system-on-chip (SoC) devices. It will ...

With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically &#8212 making it almost impossible to test an entire design once it ...

Over the last few years, design-for-test (DFT) chip-testing techniques such as internal scan (ISCAN), automatic test-pattern generation (ATPG), built-in self-test (BIST), and boundary scan (BSCAN) ...