Mass spectrometry and ion beam analysis constitute pivotal techniques in modern analytical science, offering unparalleled sensitivity and spatial resolution in the characterisation of materials. These ...

In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...

Researchers have developed a muon-based approach to non-destructive investigations for unique asteroid samples, report scientists. Japanese researchers from Osaka University have developed a ...

Users of beam profile analysis systems increasingly require packages that can be scaled to include additional cameras in multi-user environments, and that can feed data into user-defined routines to ...