Electromigration (EM) remains a critical reliability challenge in modern microelectronic systems, particularly as device miniaturisation and increased current densities intensify the phenomenon. In ...

Space is a tough place for electronic circuits since radiation causes short circuits that result in mission failure, said Hwai Lin Khor, vice president of Zero-Error ...

“Due to the resistance of metal wires in power grid network, voltage drop noise occurs in the form of IR drop which may change the output logic of underlying circuits and may affect the reliability ...