AZOM

Fiber Analysis – Using SEM for the Quality Analysis of Fibers

Devices and objects produced from fibers are being increasingly used in everyday life. Fibers are generally imaged in a scanning electron microscope (SEM), which provides elemental analysis, ...
AZoNano

EDS Analysis at the Nano-scale in an SEM

The interaction volume of a characteristic X-Ray emission can be seen in Figure 1. Typical EDS analysis in an SEM is carried out at relatively high energy (greater than 10 kV), which results in a vast ...
AZOM

Desktop SEM for High-Performance Imaging and EDS Analysis — Phenom ProX Desktop SEM

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The sixth generation of Phenom ProX G6 ...
Michigan Technological University

Hitachi S-4700 FE-SEM

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
Semiconductor Engineering

Deprocessing And SEM For Semiconductor Failure Analysis

A typical semiconductor is fabricated from metal and barrier layers separated by passivation layers. A further glassivation and/or polyimide layer on top of these provides environmental and mechanical ...